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Defect Detection of Solar Cells Based on Electroluminescence Imaging

Authors :
Zhang Fengyan
Wen-Zhi Chen
Zhang Ran
Li Chao
Source :
Chinese Journal of Luminescence. 34:1028-1034
Publication Year :
2013
Publisher :
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2013.

Subjects

Subjects :
Radiation
Materials science
business.industry
Optoelectronics
Biasing
Thin film
Electroluminescence
Condensed Matter Physics
business
Electronic, Optical and Magnetic Materials

Details

ISSN :
10007032
Volume :
34
Database :
OpenAIRE
Journal :
Chinese Journal of Luminescence
Accession number :
edsair.doi...........3037771a89c8a8cf12909f1ca18100a3

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