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Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper)

Authors :
Yue Xi
Xinyi Li
Junhao Chen
Ruofei Hu
Qingtian Zhang
Zhixing Jiang
Feng Xu
Jianshi Tang
Source :
2023 IEEE International Reliability Physics Symposium (IRPS).
Publication Year :
2023
Publisher :
IEEE, 2023.

Details

Database :
OpenAIRE
Journal :
2023 IEEE International Reliability Physics Symposium (IRPS)
Accession number :
edsair.doi...........2fcb44ff0599e0f12ca602be89ffb31f

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