Back to Search
Start Over
Performance of a Silicon-Drift Detector in 200kV TEM Environments
- Source :
- Microscopy and Microanalysis. 15:228-229
- Publication Year :
- 2009
- Publisher :
- Oxford University Press (OUP), 2009.
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 15
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........2f10ab279af01dba5c25c554e7528004
- Full Text :
- https://doi.org/10.1017/s1431927609099061