Research on Low Ambient Short-circuit Test and X-Ray Inspection for Inner Damage of Single Encapsulation Dual Winding Reactor Models

Authors :: Ao Ming
Shi-jiu Wang
Dong-yun Shi
Du Haoyang
Zhao Chunming
Zhong-jin Xiao
Source :: Proceedings of the 2016 5th International Conference on Energy and Environmental Protection (ICEEP 2016).
Publication Year :: 2016
Publisher :: Atlantis Press, 2016.

Subjects :: Engineering
business.industry
X-ray
Mechanical engineering
Structural engineering
business
Short-circuit test
Encapsulation (networking)

Database :: OpenAIRE
Journal :: Proceedings of the 2016 5th International Conference on Energy and Environmental Protection (ICEEP 2016)
Accession number :: edsair.doi...........2ed583520cff320f880cc2fd48b94027

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