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Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future

Authors :
K. Hermenau
A. Liebel
A. Bechteler
Adrian Niculae
Heike Soltau
A. Schoning
Lothar StrĂ¼der
K. Heinzinger
Source :
Microscopy and Microanalysis. 24:796-797
Publication Year :
2018
Publisher :
Oxford University Press (OUP), 2018.

Details

ISSN :
14358115 and 14319276
Volume :
24
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........2e71f12655fc0833c6547efdfa60a351