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Carbon-induced faceting of Si(112)
- Source :
- Surface Science. 215:102-110
- Publication Year :
- 1989
- Publisher :
- Elsevier BV, 1989.
-
Abstract
- The structural stability of the Si(112) surface has been investigated using low-energy electron diffraction (LEED). Heating between 950° C and 1150° C causes faceting to the (111), (113), (525) and (255) surfaces unless great care is taken to prevent carbon contamination. Increasing the carbon concentration increases the extent of the faceting. Removal of the carbon by heating to 1250° C returns the surface orientation to (112).
- Subjects :
- chemistry.chemical_classification
Silicon
Analytical chemistry
chemistry.chemical_element
Mineralogy
Surfaces and Interfaces
Condensed Matter Physics
Surfaces, Coatings and Films
Faceting
chemistry
Electron diffraction
Structural stability
Impurity
Materials Chemistry
Thin film
Inorganic compound
Carbon
Subjects
Details
- ISSN :
- 00396028
- Volume :
- 215
- Database :
- OpenAIRE
- Journal :
- Surface Science
- Accession number :
- edsair.doi...........2dbeef129012e2d09548c3750815512c
- Full Text :
- https://doi.org/10.1016/0039-6028(89)90703-6