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Channel Geometry Impact and Narrow Sheet Effect of Stacked Nanosheet

Authors :
Ali Razavieh
Bum Ki Moon
Frougier Julien
Juntao Li
Nicolas Loubet
Chen Zhang
Gen Tsutsui
Chang-Woo Sohn
Miaomiao Wang
Jingyun Zhang
Oh-seong Kwon
Xin Miao
Tenko Yamashita
Reinaldo A. Vega
Rohit Galatage
Veeraraghavan S. Basker
Robert R. Robison
Dechao Guo
Robin Chao
Chun Wing Yeung
Andrew M. Greene
Source :
2018 IEEE International Electron Devices Meeting (IEDM).
Publication Year :
2018
Publisher :
IEEE, 2018.

Abstract

The characteristics of Stacked Nanosheet are investigated, focusing on channel geometry. For the first time, “narrow sheet effect” on carrier transport is observed. By comparing measured electron $(\mu_{e})$ and hole $(\mu_{h})$ mobilities, and the n-type/p-type opposite transconductance ( $gm$ ) trends versus sheet width ( $Wsheet$ ), we show that the mobility dependency on $Wsheet$ is attributed to reduced (100) plane conduction contribution as $Wsheet$ shrinks.

Details

Database :
OpenAIRE
Journal :
2018 IEEE International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........2d692dc9ebc140f705a4c0b8247b6ca4