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Enhanced Raman scattering in multilayer structures of porous silicon
- Source :
- Journal of Raman Spectroscopy. 42:1392-1395
- Publication Year :
- 2011
- Publisher :
- Wiley, 2011.
-
Abstract
- Multiple enhancement of the Raman scattering efficiency is observed in porous-silicon-based one-dimensional photonic bandgap (PBG) structures with tunable reflection and dispersion under excitation at 1.06 µm. The experimental results are explained as being due to the resonant increase in the effective Raman susceptibility at light wavelengths close to the PBG edges. This effect is discussed in view of possible applications in the Raman spectroscopy of molecules embedded in porous media as well as in the Raman laser based on silicon. Copyright c � 2011 John Wiley & Sons, Ltd.
- Subjects :
- Materials science
Silicon
business.industry
Physics::Optics
chemistry.chemical_element
Porous silicon
symbols.namesake
Optics
Raman laser
X-ray Raman scattering
chemistry
Dispersion (optics)
symbols
Optoelectronics
General Materials Science
Coherent anti-Stokes Raman spectroscopy
business
Raman spectroscopy
Spectroscopy
Raman scattering
Subjects
Details
- ISSN :
- 03770486
- Volume :
- 42
- Database :
- OpenAIRE
- Journal :
- Journal of Raman Spectroscopy
- Accession number :
- edsair.doi...........2d5abd15428da43e02b780bcfc23bd95
- Full Text :
- https://doi.org/10.1002/jrs.2865