Aberration-corrected High Resolution Transmission Electron Microscopy of [(SnSe)]m[MoSe2]n films

Authors :: David W. Johnson
Kurt Langworthy
Matt Beekman
Sergei Rouvimov
Wolfgang Neumann
Source :: Microscopy and Microanalysis. 18:1630-1631
Publication Year :: 2012
Publisher :: Oxford University Press (OUP), 2012.
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Subjects :: Materials science
Analytical chemistry
High-resolution transmission electron microscopy
Instrumentation

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