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Improvement of Mini-Fab Uptime by Using Multitask and Multifunctional Tools
- Source :
- IEEE Transactions on Semiconductor Manufacturing. 17:273-280
- Publication Year :
- 2004
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2004.
-
Abstract
- Multitask and multifunctional tools can process alternative operations, for example, LPCVD depositions of both Poly Si and SiN films with good repeatability and few particulates. Using those tools, we can reduce the total number of tools and the number of "only-one" tools which exist for a type of tool in the fab. We have also evaluated mini-fab availabilities using both a full calculation method and an approximate calculation method. The results show that tool reduction is more effective in obtaining good fab availability and uptime. The reduction of "only-one" tools is very important to improving mini-fab availability. The approximate calculation is simple for estimating the fab availability and offers the possibility to extend mega-fab estimations. It is also possible to use in the case that there are variations of MTTR, MTBF, and excess tool numbers.
- Subjects :
- Semiconductor thin films
Downtime
Mean time between failures
Materials science
Process (engineering)
Integrated circuit
Condensed Matter Physics
Industrial and Manufacturing Engineering
Electronic, Optical and Magnetic Materials
law.invention
Reliability engineering
Cost reduction
law
Electronic engineering
System on a chip
Electrical and Electronic Engineering
Reduction (mathematics)
Subjects
Details
- ISSN :
- 08946507
- Volume :
- 17
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Semiconductor Manufacturing
- Accession number :
- edsair.doi...........2cab1c035211d6231797f834cef87659