A reference-scan-based method for correcting the nonlinear drift of atomic force microscopy at sub-nanometer precision

MLA

Ryosuke Kizu, et al. “A Reference-Scan-Based Method for Correcting the Nonlinear Drift of Atomic Force Microscopy at Sub-Nanometer Precision.” Measurement Science and Technology, vol. 31, Mar. 2020, p. 054009. EBSCOhost, https://doi.org/10.1088/1361-6501/ab6b50.

APA

Ryosuke Kizu, Satoshi Gonda, Akiko Hirai, & Ichiko Misumi. (2020). A reference-scan-based method for correcting the nonlinear drift of atomic force microscopy at sub-nanometer precision. Measurement Science and Technology, 31, 054009. https://doi.org/10.1088/1361-6501/ab6b50

Chicago

Ryosuke Kizu, Satoshi Gonda, Akiko Hirai, and Ichiko Misumi. 2020. “A Reference-Scan-Based Method for Correcting the Nonlinear Drift of Atomic Force Microscopy at Sub-Nanometer Precision.” Measurement Science and Technology 31 (March): 054009. doi:10.1088/1361-6501/ab6b50.