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Grain Boundaries Imaged by Integration of Sobel Filtered Scanning Transmission Electron Micrographs

Authors :
Min-Chul Kang
Cheol-Woong Yang
Jin-Su Oh
Source :
Applied Microscopy. 48:132-133
Publication Year :
2018
Publisher :
Korean Society of Electron Microscopy, 2018.

Details

ISSN :
22874445 and 22875123
Volume :
48
Database :
OpenAIRE
Journal :
Applied Microscopy
Accession number :
edsair.doi...........2c3fd7f7ee6e2087ff04bd1e02b457ed