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Effect of Temperature Induced Phase Variation in ALD TiO2 Dielectric on the Switching Behaviour of RRAM Devices

Authors :
Anurag Dwivedi
Shalu Saini
Anil Lodhi
Harshit Agarwal
Shree Prakash Tiwari
Source :
2022 IEEE International Conference on Emerging Electronics (ICEE).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE International Conference on Emerging Electronics (ICEE)
Accession number :
edsair.doi...........2c29ceea37c562f871574fdd12cb5bdb

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