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Effect of Temperature Induced Phase Variation in ALD TiO2 Dielectric on the Switching Behaviour of RRAM Devices
- Source :
- 2022 IEEE International Conference on Emerging Electronics (ICEE).
- Publication Year :
- 2022
- Publisher :
- IEEE, 2022.
Details
- Database :
- OpenAIRE
- Journal :
- 2022 IEEE International Conference on Emerging Electronics (ICEE)
- Accession number :
- edsair.doi...........2c29ceea37c562f871574fdd12cb5bdb