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WO3 and W Thermal Atomic Layer Etching Using 'Conversion-Fluorination' and 'Oxidation-Conversion-Fluorination' Mechanisms

Authors :
Nicholas R. Johnson
Steven M. George
Source :
ACS Applied Materials & Interfaces. 9:34435-34447
Publication Year :
2017
Publisher :
American Chemical Society (ACS), 2017.

Abstract

The thermal atomic layer etching (ALE) of WO3 and W was demonstrated with new “conversion-fluorination” and “oxidation-conversion-fluorination” etching mechanisms. Both of these mechanisms are based on sequential, self-limiting reactions. WO3 ALE was achieved by a “conversion-fluorination” mechanism using an AB exposure sequence with boron trichloride (BCl3) and hydrogen fluoride (HF). BCl3 converts the WO3 surface to a B2O3 layer while forming volatile WOxCly products. Subsequently, HF spontaneously etches the B2O3 layer producing volatile BF3 and H2O products. In situ spectroscopic ellipsometry (SE) studies determined that the BCl3 and HF reactions were self-limiting versus exposure. The WO3 ALE etch rates increased with temperature from 0.55 A/cycle at 128 °C to 4.19 A/cycle at 207 °C. W served as an etch stop because BCl3 and HF could not etch the underlying W film. W ALE was performed using a three-step “oxidation-conversion-fluorination” mechanism. In this ABC exposure sequence, the W surface is fir...

Details

ISSN :
19448252 and 19448244
Volume :
9
Database :
OpenAIRE
Journal :
ACS Applied Materials & Interfaces
Accession number :
edsair.doi...........2c055f1d615d3d9786f5cd5a80290b36