Micro-Scanning Error Correction Technique for Microscope Thermal Imaging System

Authors :: 张博智 Zhang Bozhi
祖振龙 Zu Zhenlong
李时雨 Li Shiyu
杨铭 Yang Ming
高美静 Gao Meijing
王留柱 Wang Liuzhu
Source :: Laser & Optoelectronics Progress. 55:051103
Publication Year :: 2018
Publisher :: Shanghai Institute of Optics and Fine Mechanics, 2018.

Subjects :: Materials science
Microscope
Optics
law
business.industry
Thermal
Electrical and Electronic Engineering
Error detection and correction
business
Atomic and Molecular Physics, and Optics
law.invention

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