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Transport properties of submicron YBa2Cu3O7−δ step-edge Josephson junctions
- Source :
- Journal of Applied Physics. 90:3450-3454
- Publication Year :
- 2001
- Publisher :
- AIP Publishing, 2001.
-
Abstract
- Submicron step-edge Josephson junctions in YBa2Cu3O7−δ (YBCO) thin films were fabricated and studied. All measured junctions fall into three categories: low critical current resistively shunted Josephson junctions, intrinsic Josephson junctions, and quasiparticle tunnel junctions. The transport in the junctions is correlated with the microstructure of YBCO films grown on the step edge. We argue that the properties of conventional step-edge junctions can be understood as a superposition of those types.
- Subjects :
- Josephson effect
Materials science
High-temperature superconductivity
Condensed matter physics
General Physics and Astronomy
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
Microstructure
law.invention
SQUID
Pi Josephson junction
law
Condensed Matter::Superconductivity
Quasiparticle
Superconducting tunnel junction
Thin film
Subjects
Details
- ISSN :
- 10897550 and 00218979
- Volume :
- 90
- Database :
- OpenAIRE
- Journal :
- Journal of Applied Physics
- Accession number :
- edsair.doi...........2b54c8724ce8826eb15d317cdc721f52