Casual modeling of yield

MLA

Jeffrey Weintraub, and Scott Warrick. “Casual Modeling of Yield.” Metrology, Inspection, and Process Control for Microlithography XXXIII, Mar. 2019. EBSCOhost, https://doi.org/10.1117/12.2515080.

APA

Jeffrey Weintraub, & Scott Warrick. (2019). Casual modeling of yield. Metrology, Inspection, and Process Control for Microlithography XXXIII. https://doi.org/10.1117/12.2515080

Chicago

Jeffrey Weintraub, and Scott Warrick. 2019. “Casual Modeling of Yield.” Metrology, Inspection, and Process Control for Microlithography XXXIII, March. doi:10.1117/12.2515080.