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FDSOI for cryoCMOS electronics: device characterization towards compact model

Authors :
M. Casse
B. Cardoso Paz
F. Bergamaschi
G. Ghibaudo
F. Serra
G. Billiot
A. G. M. Jansen
Q. Berlingard
S. Martinie
T. Bedecarrats
L. Contamin
A. Juge
E. Vincent
P. Galy
M.A Pavanello
M. Vinet
T. Meunier
F. Gaillard
Source :
2022 International Electron Devices Meeting (IEDM).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........2ad325614219ccf345932b5959400225

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