Finite Rate of Innovation Principle Applied to Terahertz Signals

To fully extract useful and accurate information from sample data, signal processing techniques are required. In this work, the finite rate of innovation method is applied to both randomised simulated data and a simple terahertz test scan for verification of the method. The key benefit of this method is the low sampling rate it allows. It is shown that this method produces accurate results whilst being faster than other current methods, such as sparse deconvolution, as the sampling rate is low. This faster data acquisition is especially useful for sampling time varying samples.