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Test and reliability: partners in IC manufacturing. 2
- Source :
- IEEE Design & Test of Computers. 16:66-73
- Publication Year :
- 1999
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 1999.
-
Abstract
- This article discusses the major gate oxide failure modes, reliability modeling, burn-in, and qualification testing. We present a typical method to calculate failure rates.
Details
- ISSN :
- 07407475
- Volume :
- 16
- Database :
- OpenAIRE
- Journal :
- IEEE Design & Test of Computers
- Accession number :
- edsair.doi...........292cee756d11cf5489cea60576fb32ab
- Full Text :
- https://doi.org/10.1109/54.808215