Back to Search Start Over

Weak localization and universal conductance fluctuations in multi-layer graphene

Authors :
Tak-Pong Woo
Chi-Te Liang
Nobuyuki Aoki
Yuichi Ochiai
Akram M. Mahjoub
Chiashain Chuang
Li-Hung Lin
Takahiro Ouchi
Chang-Shun Hsu
Chia-Pei Chin
Source :
Current Applied Physics. 14:108-111
Publication Year :
2014
Publisher :
Elsevier BV, 2014.

Abstract

We have performed magneto transport measurements on a multi-layer graphene device fabricated by conventional mechanical exfoliation. Suppression of weak localization (WL) as evidenced by the negative magnetoresistance (NMR) centered at zero field, and reproducible universal conductance fluctuations (UCFs) are observed. Interestingly, it is found that the phase coherence lengths calculated by fitting the observed NMR to conventional WL theory are longer than those determined from fitting the amplitudes of the UCFs to theory in the low temperature regime ( T ≤ 8 K). In the high temperature regime ( T > 8 K), the phase coherence lengths calculated by fitting the observed NMR to conventional WL theory are shorter than those determined from fitting the amplitudes of the UCFs to theory. Our new results therefore indicate a difference in the electron phase-breaking process between the two models of WL and UCFs in graphene. We speculate that the presence of the capping and bottom graphene layers, which leads the enhancement of disorder in-between, improves the localization condition for WL effect during carrier transportation in the low temperature regime. With increasing temperature, the localization condition for WL in multi-layer graphene becomes much weaker due to strong thermal damping. Therefore, the phase coherence lengths calculated by fitting the observed NMR to conventional WL theory are shorter than those determined from fitting the amplitudes of the UCFs to theory at high temperatures.

Details

ISSN :
15671739
Volume :
14
Database :
OpenAIRE
Journal :
Current Applied Physics
Accession number :
edsair.doi...........28e12fbc5696a4ed7213ef62723d9196
Full Text :
https://doi.org/10.1016/j.cap.2013.10.004