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Charge Collection in SOI Microdosimeters and Their Radiation Hardness

Authors :
V. A. Pan
L. T. Tran
Z. Pastuovic
D. Hill
J. Williams
A. Kok
M. Povoli
A. Pogossov
S. Peracchi
D. Boardman
J. Davis
S. Guatelli
M. Petasecca
M. L. F. Lerch
A. B. Rosenfeld
Source :
IEEE Transactions on Nuclear Science. 70:568-574
Publication Year :
2023
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2023.

Details

ISSN :
15581578 and 00189499
Volume :
70
Database :
OpenAIRE
Journal :
IEEE Transactions on Nuclear Science
Accession number :
edsair.doi...........284bf421fd9ddf7900da0e1e7171296d
Full Text :
https://doi.org/10.1109/tns.2023.3242267