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46.3: Development of Source/Drain Electrodes for Amorphous Indium Gallium Zinc Oxide Thin Film Transistors

Authors :
Po-Lin Chen
Cheng-Lung Chiang
Runze Zhan
Tzu-Chieh Lai
Yuting Chen
Junfei Shi
Jie Wu
Chengyuan Dong
Source :
SID Symposium Digest of Technical Papers. 44:640-643
Publication Year :
2013
Publisher :
Wiley, 2013.

Abstract

Tantalum etched by H2O2 solution shows best performance to be the source/drain electrodes of inverted staggered amorphous Indium Gallium Zinc Oxide thin film transistors among the investigated five metal materials. In addition, the etching property is improved significantly by adding aqueous ammonia properly.

Details

ISSN :
0097966X
Volume :
44
Database :
OpenAIRE
Journal :
SID Symposium Digest of Technical Papers
Accession number :
edsair.doi...........27f518c016ef3152b48edd0c443283c7