Back to Search
Start Over
46.3: Development of Source/Drain Electrodes for Amorphous Indium Gallium Zinc Oxide Thin Film Transistors
- Source :
- SID Symposium Digest of Technical Papers. 44:640-643
- Publication Year :
- 2013
- Publisher :
- Wiley, 2013.
-
Abstract
- Tantalum etched by H2O2 solution shows best performance to be the source/drain electrodes of inverted staggered amorphous Indium Gallium Zinc Oxide thin film transistors among the investigated five metal materials. In addition, the etching property is improved significantly by adding aqueous ammonia properly.
- Subjects :
- Aqueous solution
Materials science
Amorphous indium gallium zinc oxide
business.industry
Inorganic chemistry
technology, industry, and agriculture
Tantalum
chemistry.chemical_element
macromolecular substances
Metal
chemistry
Thin-film transistor
Etching
visual_art
Electrode
visual_art.visual_art_medium
Optoelectronics
business
Subjects
Details
- ISSN :
- 0097966X
- Volume :
- 44
- Database :
- OpenAIRE
- Journal :
- SID Symposium Digest of Technical Papers
- Accession number :
- edsair.doi...........27f518c016ef3152b48edd0c443283c7