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Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

Authors :
Judy S. Kim
Konstantin B. Borisenko
Peter D. Nellist
Jamie H. Warner
Neil P. Young
Peng Wang
Sarah J. Haigh
Angus I. Kirkland
Source :
Microscopy and Microanalysis. 20:930-931
Publication Year :
2014
Publisher :
Oxford University Press (OUP), 2014.

Subjects

Subjects :
Materials science
Nanotechnology
Wave function
Instrumentation
Computational physics

Details

ISSN :
14358115 and 14319276
Volume :
20
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........26510c0f5fffee28ef522a3bd6e02257

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