Sensitivity enhancement for total internal reflection fluorescence imaging using dielectric thin films

Authors :: Eun Jin Cho
Donghyun Kim
Yong Min Huh
Kyujung Kim
Source :: Biomedical Optics.
Publication Year :: 2008
Publisher :: OSA, 2008.
Abstract: Evanescent field enhancement was investigated experimentally based on dielectric thin films in TIRF microscopy. Field intensity enhancement measured by microbeads and live-cell imaging relative to that of a control without dielectric films was polarization dependent.

Subjects :: Total internal reflection
Total internal reflection fluorescence microscope
Optics
Materials science
Live cell imaging
business.industry
Quantum dot
Dielectric
Thin film
Dielectric thin films
business
Sensitivity (electronics)

Tools