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An Age-Dependent Prognostic Model for Nonlinear Degrading Devices Based on Diffusion Process
- Source :
- IEEE Sensors Journal. 23:9500-9511
- Publication Year :
- 2023
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2023.
- Subjects :
- Electrical and Electronic Engineering
Instrumentation
Subjects
Details
- ISSN :
- 23799153 and 1530437X
- Volume :
- 23
- Database :
- OpenAIRE
- Journal :
- IEEE Sensors Journal
- Accession number :
- edsair.doi...........25ac77bb03d00ddc238be2e0261a97e7
- Full Text :
- https://doi.org/10.1109/jsen.2023.3257160