Phenomenological analysis of heterogeneous strain fields in epitaxial thin films using x-ray scattering

MLA

Alexandre Boulle, et al. “Phenomenological Analysis of Heterogeneous Strain Fields in Epitaxial Thin Films Using X-Ray Scattering.” Journal of Physics D: Applied Physics, vol. 38, Oct. 2005, pp. 3907–20. EBSCOhost, https://doi.org/10.1088/0022-3727/38/21/012.

APA

Alexandre Boulle, René Guinebretière, & A. Dauger. (2005). Phenomenological analysis of heterogeneous strain fields in epitaxial thin films using x-ray scattering. Journal of Physics D: Applied Physics, 38, 3907–3920. https://doi.org/10.1088/0022-3727/38/21/012

Chicago

Alexandre Boulle, René Guinebretière, and A. Dauger. 2005. “Phenomenological Analysis of Heterogeneous Strain Fields in Epitaxial Thin Films Using X-Ray Scattering.” Journal of Physics D: Applied Physics 38 (October): 3907–20. doi:10.1088/0022-3727/38/21/012.