The effect of stress on the dielectric constants of Bi4Ti3O12 films

Both experiment and theory have shown that the stress has a notable impact on the polarization of Nd-doped Bi 4 Ti 3 O 12 films. In this paper, thermodynamic theory is used to study the effect of stress on the dielectric constants of Bi 4 Ti 3 O 12 films at room temperature with a two-dimensional model. Results indicate that the change of the dielectric constant for a-phase induced by the lattice distortion is far greater than that for c-phase. Considering the domain reorientation, the external tensile stress may lead to an obvious decrease in the effective dielectric constant of Bi 4 Ti 3 O 12 films.