Back to Search Start Over

Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs

Authors :
Tommaso Rizzi
Andrea Baroni
Artem Glukhov
Davide Bertozzi
Christian Wenger
Daniele Ielmini
Cristian Zambelli
Source :
2022 IEEE International Integrated Reliability Workshop (IIRW).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE International Integrated Reliability Workshop (IIRW)
Accession number :
edsair.doi...........2502c894b825e2fd0d958e0ada9676da

Tools

Authors Abstract Subjects Details