Rapid Amplitude and Group-Delay Measurement System Based on Intra-Cavity-Modulated Swept-Lasers

Authors :: C.S. Goh
M. Jablonski
K. Hsu
Sze Yun Set
Kazuro Kikuchi
Source :: IEEE Transactions on Instrumentation and Measurement. 53:192-196
Publication Year :: 2004
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 2004.
Abstract: In this paper, we present a high-speed wavelength-swept laser for application in a real-time optical device characterization system. The system is capable of simultaneous measurement of both the spectral amplitude and group-delay responses of the device-under-test, at a scan rate of 22 Hz over a wide wavelength range of 50 nm. This corresponds to a record sweep rate of >1000 nm/s.

Subjects :: Horizontal scan rate
Materials science
Wavelength range
business.industry
System of measurement
Laser
law.invention
Amplitude
Optics
law
Sweep rate
Optoelectronics
Electrical and Electronic Engineering
Spectral amplitude
business
Instrumentation
Group delay and phase delay

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