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Determining the Causes of Scanning Distortions in SEM and FIB
- Source :
- Microscopy and Microanalysis. 21:1703-1704
- Publication Year :
- 2015
- Publisher :
- Oxford University Press (OUP), 2015.
- Subjects :
- Materials science
Instrumentation
Subjects
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 21
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........2336dcfb32d94c235836201121e84c9e