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Gas Recombination in Sealed Ni-MHx Cells

Authors :
Deng-Jun Zhang
Jia-Jun Ke
Guan-Dong Zhang
Wenhua H. Zhu
Source :
Journal of Chemical Technology & Biotechnology. 69:121-129
Publication Year :
1997
Publisher :
Wiley, 1997.

Abstract

This paper focuses on investigation of gas recombination in a positive-limited-sealed Ni–MHx cell. The positive electrodes were prepared by electrochemical impregnation of fibrous nickel plaques. The metal hydride negative electrodes were made by pasting the mixture of rare-earth hydrogen storage alloy powders, conducting and binding agents on foamed nickel substrates. The measurement of the positive capacity at different charge times was used to estimate the partial current for oxygen evolution at the same time. The effects of charge rate, electrolyte saturation level and initial state of charge of the positive electrodes on the recombination were investigated in sealed Ni–MHx cells. By determining the differential capacity of nickel hydroxide electrodes, an improved mathematical model was used to evaluate the gas recombination parameters during charge, overcharge, rest and discharge of the positive-limited-sealed Ni–MHx cell. The gas recombination during rest, discharge and overdischarge was also examined. The oxygen recombination on the nickel hydroxide electrodes can be neglected due to the consumption of water when the nickel hydroxide electrodes were discharged. The longer overdischarge produced an increase in cell pressure for the sealed Ni–MHx cell at an electrolyte unsaturated level and the evolving gas can be recombined by a following recharge operation. © 1997 SCI.

Details

ISSN :
10974660 and 02682575
Volume :
69
Database :
OpenAIRE
Journal :
Journal of Chemical Technology & Biotechnology
Accession number :
edsair.doi...........22bc19020b42cd434f49a5e6a42e52f3
Full Text :
https://doi.org/10.1002/(sici)1097-4660(199705)69:1<121::aid-jctb681>3.0.co;2-d