Preparation of Pb(Zr0.52Ti0.48)O3-Ni0.5Zn0.5Fe2O4 Bilayer Thin Films and their Magnetic and Ferroelectric Properties

Ni0.5Zn0.5Fe2O4-Pb(Zr0.52Ti0.48)O3 (NZFO-PZT) composite films were prepared using sol–gel method on Si (100) substrate with different bilayer structures, namely, the NZFO/PZT (NP) and the PZT/NZFO (PN). Their structure, magnetic and ferroelectric properties were characterized by X-ray diffractometer (XRD), vibration sample magnetometer (VSM) and ferroelectric testing unit. Both the NP and the PN films exhibit coexistence of magnetic and ferroelectric properties. The overlapping sequence has much influence on the electrical properties. Whereas, such an overlapping structure of the films has slightly effect on its magnetic properties. The NP structured composite film is more suitable to get a promising magnetoelectric coupling.