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Surface Electronic Structure and Mechanical Characteristics of Copper–Cobalt Oxide Thin Film Coatings: Soft X-ray Synchrotron Radiation Spectroscopic Analyses and Modeling
- Source :
- The Journal of Physical Chemistry C. 117:16457-16467
- Publication Year :
- 2013
- Publisher :
- American Chemical Society (ACS), 2013.
-
Abstract
- Novel copper–cobalt oxide thin films with different copper/cobalt molar ratios, namely, [Cu]/[Co] = 0.5, 1, and 2, have been successfully coated on aluminum substrates via a simple and cost-effective sol–gel dip-coating method. Coatings were characterized using high resolution synchrotron radiation X-ray photoelectron spectroscopy (SR-XPS) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy, in combination with nanomechanical testing and field emission scanning electron microscopy (FESEM). The surfaces of both [Cu]/[Co] = 0.5 and 1 samples consisted primarily of fine granular nanoparticles, whereas the [Cu]/[Co] = 2 has a smoother surface. The analyses reveal that the increase of copper concentration in the synthesis process tends to promote the formation of octahedral Cu2+ which minimizes the development of octahedral Cu+, and these octahedral Cu2+ ions substitute the Co2+ site in cobalt structure host. The local coordinations of Co, Cu and O are not substantially influenced by the change...
- Subjects :
- inorganic chemicals
Materials science
Analytical chemistry
Oxide
chemistry.chemical_element
Copper
XANES
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
chemistry.chemical_compound
General Energy
chemistry
X-ray photoelectron spectroscopy
Physical and Theoretical Chemistry
Thin film
Spectroscopy
Cobalt oxide
Cobalt
Subjects
Details
- ISSN :
- 19327455 and 19327447
- Volume :
- 117
- Database :
- OpenAIRE
- Journal :
- The Journal of Physical Chemistry C
- Accession number :
- edsair.doi...........20832f0cfecb547ea480e99d39ec593a