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Time-to-Digital Converter Compiler for On-Chip Instrumentation

Authors :
Ding-Ming Kwai
Shi-Yu Huang
Yung-Fa Chou
Chia-Hua Wu
Source :
IEEE Design & Test. 37:101-107
Publication Year :
2020
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2020.

Abstract

This article proposes an automatic compiler for an on-chip time-to-digital converter (TDC) that can be used for monitoring the on-chip operating conditions such as temperature and supply voltage. The proposed compiler adopts a resilient architecture and supports self-calibration and range adjustment. In addition, a novel technique for fine-shrinking cell analysis is proposed to explore the tradeoffs among area, timing resolution, operating range, etc.

Details

ISSN :
21682364 and 21682356
Volume :
37
Database :
OpenAIRE
Journal :
IEEE Design & Test
Accession number :
edsair.doi...........202d16d0c553c6b428fa4dbbb0667080
Full Text :
https://doi.org/10.1109/mdat.2020.2991676