Challenges for Waveform Sampling and Related Technologies

Authors :: Haruo Kobayashi
Kentaroh Katoh
Shuhei Yamamoto
Yujie Zhao
Shogo Katayama
Jianglin Wei
Yonglun Yan
Dan Yao
Xueyan Bai
Anna Kuwana
Source :: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).
Publication Year :: 2022
Publisher :: IEEE, 2022.

Database :: OpenAIRE
Journal :: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
Accession number :: edsair.doi...........20042739ac90a68a85c87f88fdb3ba60
Full Text :: https://doi.org/10.1109/icsict55466.2022.9963176