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Electric field redistribution in light-emitting devices: Transient electroluminescence and time-of-flight studies
- Source :
- Synthetic Metals. 121:1681-1682
- Publication Year :
- 2001
- Publisher :
- Elsevier BV, 2001.
-
Abstract
- Light-emitting devices based on Langmuir-Blodgett films of a porphyrin derivative have been fabricated. In transient electroluminescence (EL) studies, we have observed two components: an instantaneous part and a peak part consisting of a linear rise followed by an exponential decay to a constant level. The time evolution of EL has been explained in terms of intrinsically accumulated charges and hole-induced electric field redistribution. This field redistribution has further been studied by integral mode time-of-flight technique during and after the application of voltage pulse.
- Subjects :
- Chemistry
business.industry
Mechanical Engineering
Metals and Alloys
Time evolution
Condensed Matter Physics
Space charge
Electronic, Optical and Magnetic Materials
Time of flight
Optics
Mechanics of Materials
Electric field
Materials Chemistry
Redistribution (chemistry)
Voltage pulse
Atomic physics
Exponential decay
business
Transient electroluminescence
Subjects
Details
- ISSN :
- 03796779
- Volume :
- 121
- Database :
- OpenAIRE
- Journal :
- Synthetic Metals
- Accession number :
- edsair.doi...........1ff3eb7acfc898156b26a89247f51524