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Electric field redistribution in light-emitting devices: Transient electroluminescence and time-of-flight studies

Authors :
Ronald Österbacka
Amlan J. Pal
A. Chowdhury
Henrik Stubb
Source :
Synthetic Metals. 121:1681-1682
Publication Year :
2001
Publisher :
Elsevier BV, 2001.

Abstract

Light-emitting devices based on Langmuir-Blodgett films of a porphyrin derivative have been fabricated. In transient electroluminescence (EL) studies, we have observed two components: an instantaneous part and a peak part consisting of a linear rise followed by an exponential decay to a constant level. The time evolution of EL has been explained in terms of intrinsically accumulated charges and hole-induced electric field redistribution. This field redistribution has further been studied by integral mode time-of-flight technique during and after the application of voltage pulse.

Details

ISSN :
03796779
Volume :
121
Database :
OpenAIRE
Journal :
Synthetic Metals
Accession number :
edsair.doi...........1ff3eb7acfc898156b26a89247f51524