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Influence of the hole-transport layer on the initial behavior and lifetime of inverted organic photovoltaics
- Source :
- Solar Energy Materials and Solar Cells. 95:1382-1388
- Publication Year :
- 2011
- Publisher :
- Elsevier BV, 2011.
-
Abstract
- The inverted organic photovoltaic (OPV) device architecture represents an important advancement due to the relative environmental stability of the electron transport layer (ETL) and hole-collecting contact. We investigated the initial and long-term behavior of inverted devices to identify changes taking place at the Ag hole-collecting contact. We show that efficient hole collection can be obtained after modifying the Ag contact by thermal annealing, long-term exposure to ambient atmosphere, or employing a high work function organic hole-transport layer (HTL). We find that whether or not the device employs an organic HTL, degradation of the photocurrent initially follows a simple exponential decay. After prolonged illumination (>500 h), devices with an organic HTL fail catastrophically due to a precipitous drop in photocurrent. Based on evidence for pinhole-induced degradation observed in photocurrent maps, we propose a nucleation and island growth mechanism and a model for the photocurrent behavior employing a modified Johnson–Mehl–Avrami–Kolmogorov (JMAK) equation. Devices that do not contain an HTL appear to degrade by a mechanism other than pinhole ingress resulting in a more uniform degradation of the photocurrent across the active area.
- Subjects :
- Photocurrent
Organic solar cell
Renewable Energy, Sustainability and the Environment
business.industry
Chemistry
Drop (liquid)
Nucleation
Island growth
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Optics
PEDOT:PSS
Optoelectronics
Work function
Exponential decay
business
Subjects
Details
- ISSN :
- 09270248
- Volume :
- 95
- Database :
- OpenAIRE
- Journal :
- Solar Energy Materials and Solar Cells
- Accession number :
- edsair.doi...........1fbe7ffc75fe3fa299b440a27923f898