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Direct Interbranch Relaxation of Polaritons in a Microcavity with Embedded CdSe/(Cd,Mg)Se Quantum Wells
- Source :
- Journal of Electronic Materials. 49:4531-4536
- Publication Year :
- 2020
- Publisher :
- Springer Science and Business Media LLC, 2020.
-
Abstract
- In polariton microcavities, the upper polariton branch is often hardly observable in reflectivity or photoluminescence measurements, which hampers reliable determination of the vacuum Rabi splitting value. We studied the photoluminescence excitation of a semiconductor microcavity with eight embedded CdSe/(Cd,Mg)Se quantum wells and observed a maximum in the emission from the lower polariton branch when the energy of the excitation was tuned to that of the upper polariton branch. This indicates that, in microcavities, where the upper polariton branch is hardly observable but interbranch polariton relaxation is efficient, the Rabi splitting value can be determined based on the energy difference between the absorption and emission maxima in photoluminescence excitation measurements. The Rabi splitting value of the studied sample as determined by reflectivity measurements was 18 ± 2 meV. Strong coupling conditions allow us to observe lasing with a relatively low threshold of 0.24 kW cm−2.
- Subjects :
- Photoluminescence
Materials science
Physics::Optics
02 engineering and technology
01 natural sciences
law.invention
law
0103 physical sciences
Materials Chemistry
Polariton
Photoluminescence excitation
Electrical and Electronic Engineering
010306 general physics
Absorption (electromagnetic radiation)
Quantum well
Condensed Matter::Quantum Gases
Condensed Matter::Other
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
021001 nanoscience & nanotechnology
Condensed Matter Physics
Optical microcavity
Electronic, Optical and Magnetic Materials
Atomic physics
0210 nano-technology
Lasing threshold
Excitation
Subjects
Details
- ISSN :
- 1543186X and 03615235
- Volume :
- 49
- Database :
- OpenAIRE
- Journal :
- Journal of Electronic Materials
- Accession number :
- edsair.doi...........1f78f5e2637017d87f66f2368126ee3e
- Full Text :
- https://doi.org/10.1007/s11664-020-08223-6