In-Situ TEM Investigation of Controlled VLS Silicon Nanowire Device Formation and Characterization

Authors :: Federico Panciera
Sardar Bilal Alam
Michael Norton
F.M. Ross
Kristian Mølhave
Ole Hansen
Source :: Microscopy and Microanalysis. 22:60-61
Publication Year :: 2016
Publisher :: Oxford University Press (OUP), 2016.

Subjects :: In situ
Materials science
Nanotechnology
02 engineering and technology
010402 general chemistry
021001 nanoscience & nanotechnology
0210 nano-technology
Silicon nanowires
01 natural sciences
Instrumentation
0104 chemical sciences
Characterization (materials science)

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