Cite
Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitors
MLA
Clement Merckling, et al. “Improved AC Conductance and Gray-Brown Methods to Characterize Fast and Slow Traps in Ge Metal–oxide–semiconductor Capacitors.” Journal of Applied Physics, vol. 111, Mar. 2012, p. 054102. EBSCOhost, https://doi.org/10.1063/1.3691898.
APA
Clement Merckling, Sharon Cui, Guy Brammertz, Johan Dekoster, Xiao Sun, Dennis K.J. Lin, & T. P. Ma. (2012). Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitors. Journal of Applied Physics, 111, 054102. https://doi.org/10.1063/1.3691898
Chicago
Clement Merckling, Sharon Cui, Guy Brammertz, Johan Dekoster, Xiao Sun, Dennis K.J. Lin, and T. P. Ma. 2012. “Improved AC Conductance and Gray-Brown Methods to Characterize Fast and Slow Traps in Ge Metal–oxide–semiconductor Capacitors.” Journal of Applied Physics 111 (March): 054102. doi:10.1063/1.3691898.