Back to Search Start Over

Bias Polarity Dependent Resistive Switching Behaviors in Silicon Nitride-Based Memory Cell

Authors :
Min-Hwi Kim
Seongjae Cho
Sungjun Kim
Byung-Gook Park
Source :
IEICE Transactions on Electronics. :547-550
Publication Year :
2016
Publisher :
Institute of Electronics, Information and Communications Engineers (IEICE), 2016.

Details

ISSN :
17451353 and 09168524
Database :
OpenAIRE
Journal :
IEICE Transactions on Electronics
Accession number :
edsair.doi...........1de7e85d0800b1afe71d81a2176abee9
Full Text :
https://doi.org/10.1587/transele.e99.c.547