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Charge Balance and UIS Robustness of Trench Field Plate Power MOSFETs

Authors :
Tanuj Saxena
Christian Torrent
Vishnu Khemka
Ganming Qin
Mark Gibson
Source :
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Accession number :
edsair.doi...........1de2c90195a29f47d6ec21f36364c555

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