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Signal Integrity Improvement on High-Speed Packaging Routing by Enhanced T Stub

Authors :
Yi-Chuan Ding
Ming-Lung Kung
Yen-Chung Lin
Ken-Huang Lin
Hung-Hsiang Cheng
Ting-Rui Chen
Yun-Hsiang Tien
Source :
2020 15th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Publication Year :
2020
Publisher :
IEEE, 2020.

Abstract

In this paper, T stub is adopted in the microstrip lines of the high-speed packaging to reduce the crosstalk. The impedance matching is also improved by using the enhanced core via with optimized surrounding ground vias. The simulation results show the lower far-end crosstalk and better impedance matching design are achieved. The signal integrity of the high-speed packaging has been improved and verified by the eye-diagram performance in the experiments.

Details

Database :
OpenAIRE
Journal :
2020 15th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
Accession number :
edsair.doi...........1cd2bc8a3f9377539af1bb847b4d5671