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Effect of the interface on the local structure of Ge–Si nanostructures
- Source :
- Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 20:1116-1119
- Publication Year :
- 2002
- Publisher :
- American Vacuum Society, 2002.
-
Abstract
- We first discuss the limitations of Raman scattering as applied to Ge/Si nanostructures. We further summarize our recent efforts to investigate the local structure of various Ge nanostructures, namely, Ge quantum dots grown by molecular beam epitaxy (MBE) on bare Si(100), on Si(111) with a 0.3 nm SiO2 coverage, and nanocrystals embedded in SiO2, by x-ray absorption fine structure spectroscopy. In particular, the MBE growth of Ge dots on bare Si(100) has been studied as a function of the growth conditions: in most cases strong alloying with Si takes place. Ge nanoislands on Si(111) with SiO2 coverage, on the other hand, may retain the local structure of bulk Ge and be very stable against oxidation. The Ge nanocrystals embedded in SiO2 possess the structure of relaxed bulk Ge without any Ge–Si bonding. The latter two kinds of Ge nanostructures possess visible photoluminescence.
- Subjects :
- Photoluminescence
Materials science
Extended X-ray absorption fine structure
business.industry
chemistry.chemical_element
Germanium
Nanotechnology
Surfaces and Interfaces
Condensed Matter Physics
XANES
Surfaces, Coatings and Films
symbols.namesake
chemistry
Nanocrystal
Quantum dot
symbols
Optoelectronics
business
Raman spectroscopy
Molecular beam epitaxy
Subjects
Details
- ISSN :
- 15208559 and 07342101
- Volume :
- 20
- Database :
- OpenAIRE
- Journal :
- Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
- Accession number :
- edsair.doi...........1caf994f9f45cf1399b53b87321258c0