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Evaluation of ellipsometric measurements using complex strategies
- Source :
- Thin Solid Films. :95-100
- Publication Year :
- 2004
- Publisher :
- Elsevier BV, 2004.
-
Abstract
- Results are presented of a study of the inverse problem of ellipsometry. In the lack of inverse equations, iterative methods (search) are needed to find the optimal parameters (global minimum) of the adaptive optical model. Different kinds of optical models and search strategies are demonstrated and compared for evaluating real ellipsometric measurements. It is also demonstrated that the well-known gradient search alone is useless if the search space is large (few a-priori information) or the error surface is hilly. The applied algorithms were built in a software, which is freely available at polgaro@mfa.kfki.hu.
- Subjects :
- business.industry
Computer science
Iterative method
Semiconductor materials
Metals and Alloys
Physics::Optics
Inverse
Surfaces and Interfaces
Inverse problem
Space (mathematics)
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Optics
Software
Materials Chemistry
business
Anisotropy
Algorithm
Error surface
Subjects
Details
- ISSN :
- 00406090
- Database :
- OpenAIRE
- Journal :
- Thin Solid Films
- Accession number :
- edsair.doi...........1ca7c768a44956ef29b8919ae95ebcab