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A Multichannel Detector for Monitoring the Degradation of Scintillation and Semiconductor Detectors in Low-Intensity Heavy-Ion Beams
- Source :
- Instruments and Experimental Techniques. 63:334-338
- Publication Year :
- 2020
- Publisher :
- Pleiades Publishing Ltd, 2020.
-
Abstract
- The description of detectors based on measuring the secondary-emission current and results of their tests are presented. Multichannel profilometers with a range of n × 103 to 109 ions/(cm2 s) have been created. This range is largely overlapped with the range from a few units to 106 ions/(cm2 s), which is characteristic of scintillation and semiconductor detectors. Current profilometers are used in the region of the overlap to monitor their degradation under exposure to the beam. The current profilometers are used in the transit of low-intensity beams, and their sensitivity is higher than the sensitivity of Al2O3 phosphors and Faraday cups by four orders of magnitude. A three-lamel probe has been created based on the secondary emission to measure the current of the internal accelerator beam with a lower-range value of 0.1 pA.
- Subjects :
- 010302 applied physics
Scintillation
Materials science
010308 nuclear & particles physics
business.industry
Orders of magnitude (temperature)
Detector
01 natural sciences
law.invention
Semiconductor detector
Ion
Optics
law
Secondary emission
0103 physical sciences
Faraday cage
business
Instrumentation
Beam (structure)
Subjects
Details
- ISSN :
- 16083180 and 00204412
- Volume :
- 63
- Database :
- OpenAIRE
- Journal :
- Instruments and Experimental Techniques
- Accession number :
- edsair.doi...........1c6da3f6c4ea7669dbbf3cef103b4853