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Optical lithography—present and future challenges

Authors :
Burn Jeng Lin
Source :
Comptes Rendus Physique. 7:858-874
Publication Year :
2006
Publisher :
Elsevier BV, 2006.

Abstract

Optical lithography has been an industrial workhorse for many decades. It has reached a wavelength of 193 nm, a Numerical Aperture (NA) of 0.93 but was facing difficulties to advance further until the debut of immersion lithography. This review deals with the limit of dry and immersion lithography systems, their present and future challenges to reach these very limits. A discussion of defects in immersion lithography, the status of immersion lithography, polarized illumination, high-index materials, solid-immersion mask, double exposure and double patterning is included. To cite this article: B.J. Lin, C. R. Physique 7 (2006).

Details

ISSN :
16310705
Volume :
7
Database :
OpenAIRE
Journal :
Comptes Rendus Physique
Accession number :
edsair.doi...........1b7b51b933ac0ac4abc6bbd94db8563e
Full Text :
https://doi.org/10.1016/j.crhy.2006.10.005