Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy

Authors :: Nobuo Tanaka
Jun Yamasaki
Y. Nomura
K. Okazaki-Maeda
S. Inamoto
Source :: Microscopy and Microanalysis. 18:514-515
Publication Year :: 2012
Publisher :: Oxford University Press (OUP), 2012.
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Subjects :: Crystallography
Materials science
Structure analysis
business.industry
Transmission electron microscopy
Interface (Java)
Stacking
Optoelectronics
business
Instrumentation

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