Measurement of an obliquely incident soft x‐ray with a microchannel plate

A 4‐keV soft x ray is measured using a microchannel plate (MCP) and a visible light multichannel analyzer. A transparent photocathode is mounted in close contact with the front surface of the MCP to compensate for the reduction in gain of the obliquely incident soft x ray. Favorable improvement in sensitivity was obtained even at a large incident angle without reduction in the resolving power.